中文摘要：

通过优化Mg流量增强了MOCVD生长的GaN薄膜的p型电导并改善了晶体质量.Hall测量结果表明空穴浓度首先随着Mg流量的升高而升高,达到极大值后开始降低;迁移率始终随Mg流量的升高而降低.最优的样品在室温下空穴浓度达到4.1×10^17cm-3,电阻率降至1Ω.cm.考虑施主型缺陷MGaVN的自补偿作用,计算了空穴浓度随掺杂浓度变化的曲线关系.计算结果表明自补偿系数随掺杂浓度的增大而增大;空穴浓度首先随掺杂浓度的增大而增加,在受主浓度为NA≈4×10^19左右时达到极大值,之后随着掺杂浓度的增大而迅速降低.XRD数据表明在实验范围内晶体缺陷密度随着掺杂浓度的降低而降低.

英文摘要：

p-type conductivity and crystal quality of Mg-doped GaN grown by MOCVD have been improved through opti- mization of the magnesium flow rate. The hole concentration first increased and then decreased with the magnesium flow rate while the mobility decreased monotonously. The optimum sample reached a hole concentration of 4. 1×10^17cm -3 and a resistivity of 1Ω·cm. Based on a self-compensation model involving the deep donor Mo, VN, we calculate the hole con- centration as a function of magnesium doping concentration NA ,which indicates that the self-compensation coefficient in- creases with NA;the hole concentration first increases with NA and reaches a maximum at NA≈4×10^19 ,then decreases rapidly as doping concentration increases. XRD also indicate that dislocation density decreased as magnesium flow rate decreased.