基于GaN转移电子器件最基本的工作模式——畴渡越时间模式,计算了GaN转移电子器件的理想最高振荡频率,得到该类型微波转移电子器件的最高振荡频率可达4.7THz,接近GaAs转移电子器件最高振荡频率(0.6THz)的8倍.从理论上计算出GaN转移电子器件的理想最大输出功率,结果表明GaN转移电子器件在功率输出方面具有很大优势.最后还讨论了GaN转移电子器件在畴渡越时间模式下,能够产生稳定Gunn振荡的两个基本条件,即电子浓度N与器件有源区长度L乘积要大于该器件的设计标准((NL)。=6.3×10^12cm^-2)及有源区的掺杂浓度N要小于临界掺杂浓度Ncrit(3.2×10^17cm^-3).本工作揭示出GaN转移电子器件在高频率和大功率输出方面都具有重要优势,作为大功率THz微波信号源将具有广阔的应用前景.
Based on the basic transit-time domain operation mode of TEDs,we first calculated the ideal maximum oscillation frequency of GaN-based transferred-electron devices (TEDs) ,which can be as high as 4.7THz. This value is nearly 8 times as high as that of GaAs-based TEDs, which is about 0.6 THz. Next,we calculated the maximum output power of GaN-based TEDs indicating that GaN- based TEDs are promising for high microwave power applications. We also discussed the two critical conditions in GaN-based design for generating stable Gunn oscillations in transit-time domain mode. Our calculation indicates that the product of electron concentration and the length of active layer should be higher than a critical value of 6.3 × 10^12 cm^-2 ; and the doping lever of the active layer has to be smaller than a critical level of 3.2 × 10^17 cm^-3. This study suggests that GaN-based TEDs have significant advantages for high-frequency and high-power microwave generation,which are perspective for high-power THz signal source applications.