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Investigation of Threshold Ion Range for Accurate Single Event Upset Measurements in Both SOI and Bu
  • ISSN号：0018-9499
  • 期刊名称：IEEE Transactions on Nuclear Science
  • 时间：2014.6
  • 页码：1459-1467
  • 相关项目：地面模拟空间辐射环境下的技术方法及单粒子效应研究
作者： Mo, Dan|Liu, Gang|Han, Zhengsheng|En, Yunfei|
同期刊论文项目
地面模拟空间辐射环境下的技术方法及单粒子效应研究
期刊论文 56 会议论文 3
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