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Nondestructive two-dimensional phase imaging of embedded defects via on-chip spintronic sensor
  • ISSN号：0003-6951
  • 期刊名称：Applied Physics Letters
  • 时间：2012
  • 页码：-
  • 相关项目：微波成像新型自旋电子学材料与器件研究
作者： Cao, Z.X.|Harder, M.|Fu, L.|Zhang, B.|Lu, W.|Bridges, G.E.|Gui, Y.S.|Hu, C.-M.|
同期刊论文项目
微波成像新型自旋电子学材料与器件研究
期刊论文 7 会议论文 2
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