中文摘要：

可见一近红外（vis—NIR）高光谱成像技术应用于土壤科学是当前数字土壤研究的新方向。本研究考察了该技术预测土壤剖面氮素垂直分布的可行性。深达1m的土壤整段剖面（1000mm×170mm×65mE）采自湖北崇阳县，成像光谱仪配备了25μm狭缝，视场角13．1°的35rftm焦距镜头和1004×1002像素的面阵CCD，拍摄得到剖面vis—NIR高光谱影像（400—1000nm共753个波段）。对获取的影像先通过几何校正解决影像形变问题，再采用监督分类方法识别提取有效土壤像素，剔除阴影裂缝等无效像素。最后利用室内土样vis—NIR反射光谱建立的土壤全氮校正模型，对3个土壤整段剖面的高光谱影像数据进行全氮（TN）预测制图。结果表明，vis—NIR成像光谱技术对土壤整段剖面TN含量预测效果达到甚至优于经标准制样处理后所建模型精度。但存在纵向局限性，其良好地还原了浅层土壤氮素的分布规律，0，600mm为较佳预测深度。

英文摘要：

The study on soil profiles and the various soil horizons they consist of are of great significance to the studies on soil genesis and development, soil classification, and some other disciplines of soil science. Traditional soil information acquisition methods are both time-and labor-consuming, however, the proximal soil sensing technology can be used to provide soil information of various scales rapidly and periodically, and has been widely applied to researches such as soil resource survey, land quality evaluation, soil classification, soil mapping, etc. Traditional methods for measuring soil physical and chemical properties are complicated, time-consuming and costly, and can hardly meet the demands for rapid monitoring of changes in soil property. In recent years, the spectrometric technology has extensively been used to quantitatively analyze samples in a fast, simple and non-destructive way in various fields with results. The data acquired with using the imaging technology combined with the spectroscopic technology are high in both spatial resolution and spectral resolution, and contain very rich soil remote sensing information and hence can provide a solid foundation for quantitative monitoring and mapping of soils properties in the horizontal dimension. However, in the light of the researches done by scholars both at home and abroad, it appears that the study of soil science still lacks an imaging technique high in spatial and spectral resolution, specifically for measuring soil total nitrogen （ TN ） contents in entire soil profiles. At present, quantitative analyses of soil properties mostly use soil samples collected in the topsoil, 0 ~ 150 mm or 0 - 200 mm in depth; studies on soil point samples in the profile 0 ~ 1 000 mm in depth are rarely reported, and little has been found in literature on dot samples in the 0 ~ 1 000 mm soil profile, let alone reports on mapping of vertical distribution of soil TN contents in entire soil profiles. In view of this situation, this study is oriented to explore th