中文摘要：

Cubic boron nitride(c-BN) films were deposited on HSS substrate implanted with nitrogen ion by RF-magnetron sputtering. The films were analyzed by bending beam method, scratch test, XRD and AFM. The results show that the implantation of N ion can reduce the internal stress and improve the adhesion strength of the films.The critical load comes to 16.92N, compared to 1.75N of c-BN film on the unimplanted HSS. AFM shows that the surface of the c-BN film on the implanted HSS is low in roughness and small in grain size. The phase structure of the nitrogen implanted layer was analyzed by XRD. The influence of nitrogen implanted layer on the internal stress and adhesion strength of c-BN films were also investigated.