中文摘要：

以库房贮存背景下的J599系列电连接器为研究对象,分析电连接器在贮存环境下的主要失效部位及失效机理,确定了接触失效为最主要的失效模式,而接触对表面氧化物膜层增厚使得膜层电阻增大是造成接触失效最主要的原因;结合氧化物膜层的增长规律、膜层生长的化学反应理论以及接触对的功能与结构,进一步从微观层面对膜层电阻的生长规律进行了描述;基于电连接器接触电阻退化轨迹、接触退化率在温度应力水平下的变化规律以及接触可靠度与接触性能退化量之间的关系,建立电连接器的贮存可靠性统计模型;综合考虑镀层厚度、孔隙率、接触件基体材料、开槽簧片长度以及微观表面形态等尺寸、工艺和材料参数与其可靠性指标之间的关系,建立电连接器可靠性设计的数学模型,提出了电连接器可靠性定量设计的方法。

英文摘要：

The J599 series electrical connectors which in warehouse storage environment are taken as research objects, after analyzing their structures and failure modes in the storage environment and understanding the failure mechanisms, the contact failure is determine as the main failure mode of the electrical connector in the storage environment,and the contact surface oxide film layer thickening which makes the membrane resistance increase is the main reason causes the contact failure; Combined with the growth of the oxide film, film growth theory of chemical reaction and the structure of contact pairs, the growth law of membrane resistance is described from the microscopic perspective; Based on the electrical connector＇s contact resistance degradation path, the changing rule of the degradation rate under temperature stress as well as the contact reliability and performance degradation, the statistical model of the electrical connector＇s storage reliability is established; Considering the relationship among the electrical connector contact reliability and material parameters about coating thickness, porosity, contact materials, slotted length of reed and microscopic surface morphology etc., the electrical connector reliability design model is established,and the reliability quantitative design method is proposed.