综述了不同的研究方法对太阳电池多晶硅中位错与杂质的影响,同时分析了缺陷与硅片电学性能的关系。对比发现,不同的研究过程,得出的结论侧重点不同。
This paper reviewed the effect of different research methods on dislocations and impurities of muhicrystalline silicon for solar cells, and the relation between defects and the electrical properties of silicon wafers were investigated. Comparison showed that different research processes would lead to different conclusions.