分析了在储存环中回旋的离子束与残余气体分子、内靶和冷却电子束相互作用时的损失机制及相应的束流寿命,针对兰州重离子加速器冷却储存环实验环内靶模式,计算了50-500MeV/u ^12C^6+,^36Ar^18+,^132Xe^54+和^238U^92+等束流在各种损失机制影响下所对应的束流寿命和总的束流寿命。结果表明:影响束流寿命的主要因素是与内靶分子(原子)之间的电荷交换及与冷却电子束之间的辐射复合;对于重离子束^132Xe^54+和^238U^92+,与冷却电子束之间的辐射复合是影响其储存寿命的主要因素。
The loss mechanism and lifetime of ion beams in collisions with residual gas, internal target and electrons in e-cooler in heavy ion cooler storage rings were studied. The partial beam lifetimes resulting from various loss mechanisms and the total beam lifetimes of 50-500 MeV/u ^12C^6+,^36Ar^18+,^132Xe^54+ and ^238U^92+ stored in the experimental ring of the Cooler Storage Ring at the Heavy Ion Research Facility in Lanzhou (HIRFL-CSR) were calculated. The calculations indicate that the charge exchange process between ion beams and the internal target, as well as the radiative recombination process with the electrons in e-cooler restrict the beam lifetime considerably. For heavy ion beams such as ^132Xe54^+ and ^238U^92+, the radiative recombination is the dominant loss mechanism.