考虑微焦点X射线仪成像信噪比低,混合噪声污染严重等问题,提出了一种乘性、加性混合噪声去除方法.首先,建立了含乘性、加性混合噪声的图像模型;其次,基于总变分和稀疏表示原理分别构造了滤除加性噪声和乘性噪声的目标函数;最后,应用显式差分算法和梯度投影算法分步滤除加性噪声和乘性噪声.实验结果显示,与总变分去加性噪声方法相比,该方法处理后的图像平滑区域均值与标准差比(MSR)平均提升了10.9%,细节区域拉普拉斯梯度模(LS)平均提升了15.6%.这些结果表明:本文算法不仅有效滤除了微焦点X射线图像的混合噪声,并且较好地保留了图像细节特征,能够满足集成电路内部缺陷检测对图像平滑度和细节清晰度的要求.
In consideration of the lower imaging Signal to Noise Ratio(SNR) and serious mixed noise of a micro-focus X-ray inspector,a denoising method was proposed for the images corrupted with mixed multiplicative noise and additive noise.Firstly,an image model was established to represent the micro-focus X-ray images with mixed multiplicative and additive noises.Then,to remove the mixed noises,the objective functions were proposed based on the principle of total variation and sparse representation.Finally,the multiplicative noise and the additive noise were removed by explicit difference method and gradient projection in steps.Experiment results show that the proposed method enhances the Mean to Standard deviation Ratio(MSR) of the images by 10.9% in smooth areas,the Laplacian Sum(LS) by 15.6% in detail areas as compared with total variation algorithm for the additive noise model.The experiments demonstrate that the proposed method not only removes the mixed noises in X-ray image but also retains the details of the image edge.It meets the requirements of integrated circuit detection for image smoothness and detail definition.