欢迎您！东篱公司
退出
-
申报数据库
-
立项数据库
-
成果数据库
-
项目获奖数据库
中文摘要：
大规模高密度的集成电路在测试中遇到了测试数据量大，测试时间长等问题。对此，本文提出了一种带有折叠集的完全测试方案。该方案利用RAS（Random access scan）结构控制经输入精简的扫描单元，先生成若干折叠集检测电路中大部分的故障，然后直接控制扫描单元生成剩余故障的测试向量。本方案生成的折叠集故障检测率高，所需控制数据少。实验数据表明与同类方法相比，本方案能有效减少测试数据量和测试时间。
英文摘要：
The high density and large-scale IC meets lots of problems during test, such as huge amount of test data, long test time and so on. This paper presents a full test scheme by using folding test sets. Firstly several folding test sets are generated by random access scan structure in scan cells which are grouped by input reduction technology to detect most of the faults in circuit under test. Then data in scan ceils are modified directly to provide test patterns for the remaining faults. The folding test sets are efficient in detecting faults and they need less control information. Experiment results show that it has shorter test time and higher test data compression ratio comparing with other schemas based on RAS.
同期刊论文项目
同项目期刊论文
位置：