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High sum-frequency generation in dielectric/antiferromagnet/Ag sandwich structures
  • ISSN号:1674-1056
  • 期刊名称:《中国物理B:英文版》
  • 时间:0
  • 分类:TQ327.1[化学工程—合成树脂塑料工业] O482.5[理学—固体物理;理学—物理]
  • 作者机构:[1]Key Laboratory for Photonic and Electronic Bandgap Materials, Ministry of Education,School of Physics and Electronic Engineering, Harbin Normal University, Harbin 150025, China, [2]School of Electric Engineering, Harbin University of Science and Technology, Harbin 150080, China, [3]School of Science, Harbin University, Harbin 150086, China
  • 相关基金:Project supported by the Young Academic Back-bone of Education Commission of Heilongjiang Province, China (Grant Nos. 1251G030 and12521154) and the National Natural Science Foundation of China (Grant Nos. 11104050, 11204056, and 11074061).
中文摘要:

We present a method to increase the sum-frequency(SF) outputs in dielectric/antiferromagnet(AF)/Ag sandwich structures for a fixed input power. Two incident waves simultaneously illuminate the upper surface, one is oblique and the other is normal to it. Numerical calculations based on the SiO2/MnF2/Ag and ZnF2/MnF2/Ag structures show that the SF outputs on the upper film increase a few times as compared to those of a single AF film when the thickness of the AF film is one-quarter of the vacuum wavelength. Moreover, the SF outputs generated near the higher resonant frequency will be higher than those obtained near the lower resonant frequency. An optimum AF film thickness is achieved through investigating its effect on the SF outputs in the two different dielectric sandwich structures.

英文摘要:

We present a method to increase the sum-frequency (SF) outputs in dielectric/antiferromagnet(AF)/Ag sandwich structures for a fixed input power. Two incident waves simultaneously illuminate the upper surface, one is oblique and the other is normal to it. Numerical calculations based on the SiO2/MnF2/Ag and ZnF2/MnF2/Ag structures show that the SF outputs on the upper film increase a few times as compared to those of a single AF film when the thickness of the AF film is one-quarter of the vacuum wavelength. Moreover, the SF outputs generated near the higher resonant frequency will be higher than those obtained near the lower resonant frequency. An optimum AF film thickness is achieved through investigating its effect on the SF outputs in the two different dielectric sandwich structures.

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期刊信息
  • 《中国物理B:英文版》
  • 中国科技核心期刊
  • 主管单位:中国科学院
  • 主办单位:中国物理学会和中国科学院物理研究所
  • 主编:欧阳钟灿
  • 地址:北京 中关村 中国科学院物理研究所内
  • 邮编:100080
  • 邮箱:
  • 电话:010-82649026 82649519
  • 国际标准刊号:ISSN:1674-1056
  • 国内统一刊号:ISSN:11-5639/O4
  • 邮发代号:
  • 获奖情况:
  • 国内外数据库收录:
  • 被引量:406