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Contact resonance force microscopy for nanomechanical characterization: Accuracy and sensitivity
  • ISSN号：0021-8979
  • 期刊名称：Journal of Applied Physics
  • 时间：2013.8.8
  • 页码：064301-
  • 相关项目：铁电薄膜的应力效应及测试方法研究
作者： Zhou, Xilong|Fu, Ji|Li, Faxin|
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