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中文摘要：
针对ZnO压敏电阻经受多次8/20雷电流冲击后交流老化特性变化的问题,通过对ZnO压敏电阻老化机理的理论分析,并对ZnO压敏电阻样品进行不同次数的冲击老化实验后再进行交流老化实验测量其静态参数的变化,发现适当次数的大电流冲击会增强ZnO压敏电阻的交流耐受能力;ZnO压敏电阻的U1 mA和U0.1 mA在交流老化过程中呈现小幅上升、缓慢下降、快速减小的趋势,非线性系数则呈现持续缓慢降低而后快速下降的趋势;根据实验结果,得出电子陷阱及离子迁移是交流老化初始和中期的主要老化机理,而热破坏在老化末期起主要作用。
英文摘要：
In order to realize the AC aging characteristic of ZnO varistor when it is impacted by 8/ 20 μs impulse current. The samples of Zno varistor were firstly impacted by different times of large current, then they were put into the AC aging experiments. After the experiments, the static parameters were tested. Based on the theoretical analysis of ZnO varistor＇s aging mechanism, It is found that impacted by the proper times of impulse current, the AC withstand ability of ZnO varistor is strengthened; During the process of AC aging, UlmA and U0.1mA slowly increased at first, then decreased slowly and sharply dropped in the end. Nonlinear coefficient decreased slowly at the beginning and then quickly decreased; according to the experimental results, it is proposed that electron trap and ion immigration are the main aging mechanism during the early and middle stage of AC aging, thermal collapse plays a vital role in the later period.
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