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P-Type ECRL Circuits for Gate-Leakage Reduction in Nanometer CMOS Processes with Gate Oxide Material
  • 期刊名称：Applied Mechanics and Materials
  • 时间：0
  • 页码：1919-1924
  • 语言：英文
  • 相关项目：能量回收型绝热芯片设计的若干关键技术研究
作者： Jianping Hu|Yu Zhang|Weiqiang Zhang|
同期刊论文项目
能量回收型绝热芯片设计的若干关键技术研究
期刊论文 16 会议论文 24 获奖 2
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