借助高温扫描隧道显微镜和光电子能谱技术,深入研究了SrO/Si(100)表面向Sr/Si(100)再构表面的动态转化过程.Sr/Si(100)再构表面在硅基氧化物外延生长中起重要作用.在该动态转化过程中,样品在500℃的退火温度下,表面出现SrO晶化的现象;在550—590℃的退火温度下,SrO/Si(100)开始向Sr/Si(100)转化,界面和表面上的氧以气态的SiO溢出,使得表面出现大量凹槽状缺陷.并且在此动态转化过程中表面的电子态表现出金属特性,这是由于表层硅原子发生断键重排,从而在表面出现悬挂键产生的.
Using high temperature scanning tunneling microscopy (STM) and XPS,we investigated the dynamic process of SrO/Si(100) changing to Sr/Si(100) reconstructed surface,which plays a critical role in the growth of crystalline oxide on silicon substrate. During this process we find some interesting phenomenan:there appears crystalline SrO on Si(100) substrate at low annealing temperature of 500 ℃ ; at higher annealing temperature of 550—590 ℃ ,the oxygen in the SrO/Si(100) interface will react with silicon and form volatile SiO,leading the surface with a large quantity of line vacancies. In the later case,there appears abnormal metallic property of this surface,which results from dangling bonds of silicon atoms in the surface.