采用脉冲激光沉积技术在双轴织构的Ni95W5(Ni.5W)合金基底上外延生长了LaMnO3(LMO)薄膜作为涂层导体缓冲层,研究了沉积温度对LMO薄膜生长织构和表面形貌的影响。研究结果表明:沉积温度对LMO薄膜的表面形貌有一定的影响;在沉积温度为650℃时,LMO薄膜具有良好的(00,)取向,薄膜表面平整均匀,光滑致密,其均方根粗糙度在2nm以下;而且,在此LMO缓冲层上外延生长的YBa2Cu3,蔡传兵7-δ超导层具有良好的双轴织构,超导转变温度瓦为92K,转变宽度小于1K,临界电流密度以为5.3×10^5A/cm^2(77K,自场)。
LaMnO3 (LMO) thin films, as a single buffer layer of coated conductors, were epitaxially grown on the biaxially textured Ni95W5 (Ni-5W) alloy substrates by pulsed laser deposition (PLD). The effects of deposition temperature on the growth texture and surface morphology of the LMO films were investigated. The results show that: the deposition temperature has some effect on the surface morphology of the LMO films. At a deposition temperature of 650℃, the prepared LMO film possesses perfect (00/) orientation and shows a flat, smooth, dense and uniform surface with the root mean square (RMS) roughness below 2 nm; Moreover, the YBa2Cu3O7-δ superconducting layer epitaxially grown on this LMO film exhibits a good biaxial texture, a superconducting transition temperature (To) of 92 K with the transition width below 1 K, and a critical current density (Jr) of 5.3×10^5 A/cm2 at 77 K in self-fields.