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A New Approach for Measuring the Value of Patents based on Structural Indicators for Ego Patent Cita
ISSN号:1532-2882
期刊名称:Journal of the American Society for Information Sc
时间:2012.8.24
页码:1834-1842
相关项目:基于专利子网结构指标的科学计量方法研究
作者:
Hu XJ|Rousseau R|Chen J|
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基于专利子网结构指标的科学计量方法研究
期刊论文 19
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Two time series, their meaning and some applications.
Are Chinese nanoscience citation curves converging towards their American counterparts?
基于专利结构化数据的专利价值评估指标研究
引用网络结构指标.
基于专利向心引用网络结构指标的测定专利价值的新途径.
A refinement of Egghe’s increment studies
Describing the Development of Molecular Research in the Context of Nervous System Diseases using Yea
“中国企业创新能力50强排名”评价概况及结果
A simple approach to describe a company’s innovative activities and their technological breadth
Froma word to a world: the current situation in the interdisciplinary field of synthetic biology
Two time series, their meaning and some applications
Structural indicators in citation networks
Do first rate scientists work at first rate organizations?
A general conceptual framework for characterizing the ego in a network
Do Chinese and American contributions in top journals have an equal citation potential?
Do Chinese and American contributions in top journals have an equal citation potential?