阻变式存储器(resistive random accessmemory,RRAM)是以材料的电阻在外加电场作用下可在高阻态和低阻态之间实现可逆转换为基础的一类前瞻性下一代非挥发存储器.它具有在32nm节点及以下取代现有主流Flash存储器的潜力,成为目前新型存储器的一个重要研究方向.但阻变式存储器的电阴转变机理不明确,制约它的进一步研发与应用.文章对阻变式存储器的体材料中几种基本电荷输运机制进行了归纳,总结了目前对阻变式存储器存储机理的理论模型.
Resisitive random access memories (RRAMs) are one of the most promising next - generation non - volatile memory devices, based on reversible switching between high and low resistance states by the application of an external electric field. They have been widely studied as a remarkable new type of memory device, due to their potential for scaling down beyond the 32nm node limit to replace current mainstream flash memory devices. However, controversy about the resistance switching mechanism of RRAMs has severely limited their further development and application. In this article certain essential models of the charge-transportation in the bulk material are described, and present theories explaining the resistance switching mechanism are also reviewed.