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In situ electron holography study of charge distribution in high-κ charge -trapping memory
  • ISSN号：0028-0836
  • 期刊名称：Nature
  • 时间：2013.11.8
  • 页码：1-8
  • 相关项目：面向三维集成的纳米尺度电荷陷阱存储器机理与可靠性研究
作者： ZL Huo|M Liu|CX Zhu|CZ Gu...|
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面向三维集成的纳米尺度电荷陷阱存储器机理与可靠性研究
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