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Frequency-dependent failure mechanisms of nanocrystalline gold interconnect lines under general alte
  • ISSN号：0021-8979
  • 期刊名称：Journal of Applied Physics
  • 时间：2014
  • 页码：103509-
  • 相关项目：金属薄膜热疲劳损伤行为及其微观机制的研究
作者： Luo X. M.|Zhang B.|Zhang G. P.|
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