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Evolution of domain structure and frequency effect on ferroelectric properties in BIT ferroelectrics
  • ISSN号：1003-6326
  • 期刊名称：《中国有色金属学报：英文版》
  • 时间：0
  • 分类：O484.1[理学—固体物理;理学—物理] TB383[一般工业技术—材料科学与工程]
  • 作者机构：[1]Faculty of Materials, Optoelectronics and Physics, Xiangtan University, Xiangtan 411105, China, [2]Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, Xiangtan University, Xiangtan 411105, China
  • 相关基金：Projects（10672139, 10825209, 50872117） supported by the National Natural Science Fotmdation of China; Proj ect（207079） supported by the Key Program of Ministry of Education of China; Project（07JJ5002） supported by the Natural Science Foundation of Hunan Province, China; Project（08C862） supported by Scientific Research Fund of Hunan Provincial Education Department, China; Project（[2008]101） supported by Scientific Research Foundation for the Returned Overseas Chinese Scholars, State Education Ministry; Project（J2007]362） supported by Hunan Prestigious Fu-rong Scholar Award, China
作者： 郑学军[1,2], 卢佳[1], 周益春[1,2], 吴波[1], 陈义强[1]
关键词： 退火温度, 薄膜合成, 铁电性能, 显微组织, 漏电流密度, 原子力显微镜, 阻抗分析仪, 参数测试仪, BNKT 15 thin film, metal-organic decomposition, annealing temperature, remnant polarization, leakage current density
中文摘要：

Corresponding author： ZHENG Xue-jun; Tel： ＋86-731-58298119; E-mail： zhengxuejun@xtu.edu.cn

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期刊信息
  • 《中国有色金属学报：英文版》
  • 中国科技核心期刊
  • 主管单位:中国科学技术协会
  • 主办单位:中国有色金属学会
  • 主编：黄伯云
  • 地址：中国长沙中南大学
  • 邮编：410083
  • 邮箱：f-xsxb@csu.edu.cn
  • 电话：0731-88830949
  • 国际标准刊号：ISSN：1003-6326
  • 国内统一刊号：ISSN：43-1239/TG
  • 邮发代号:42-317
  • 获奖情况:
  • 国家“双百”期刊,第二届全国优秀科技期刊评比二等奖,中国有色金属工业总公司优秀科技期刊一等奖
  • 国内外数据库收录:
  • 俄罗斯文摘杂志,美国化学文摘（网络版）,荷兰文摘与引文数据库,美国工程索引,美国剑桥科学文摘,美国科学引文索引（扩展库）,英国科学文摘数据库,日本日本科学技术振兴机构数据库,中国中国科技核心期刊
  • 被引量:1159