针对在基因芯片光学扫描时产生的图像倾斜问题,提出了一种基于像素灰度的芯片图像倾斜校正方法。结合基因芯片图像的结构特点,基于行、列方向像素灰度定义芯片图像的校正指标。在角度检测范围内,利用折半搜索方法,基于校正指标来检测芯片图像的校正角度和芯片图像的校正位置。实验结果表明,该方法能有效地检测多类基因芯片图像的倾斜角度,具有较强的鲁棒性和实用性。
Based on pixel gray value, a skew correction method is proposed for the tilt image generated in gene-chip scanning. According to the structural characteristics of the gene-chip image, a correction index is determined based on gray of pixels on row and column. Within the range of angle detection, a binary search method is used to detect the skew angle of the gene-chip image based on the correction index. Strong robutstness and high performance of the skew correc- tion method proposed are observed in experimental results when diffrent types of gene chip images are used.