中文摘要：

采用脉冲激光沉积法制备了0.20BiInO3-0.80PbTiO3（20BI-PT）高温压电薄膜，并与0.15BiInO3-0.85PbTiO3（15BI-PT）样品进行了比较研究. X射线衍射谱显示，20BI-PT样品100峰出现了明显的劈裂，显示样品具有更高的四方对称性. FESEM图显示，20BI-PT样品中出现了部分111取向的三角形晶粒. 20BI-PT样品的铁电剩余极化（Pr）为～28 μC/cm2，矫顽场（Ec）为～120 kV/cm，相较15BI-PT样品，Pr略有增加，但同时Ec也有增加. 20BI-PT样品的横向压电系数（e31，f）约为–4.7±0.6 C/m2，和15BI-PT相比几乎一样. 介电温度谱显示，20BI-PT 样品的居里温度比15BI-PT增加了约30 ℃，达590 ℃，且介电峰没有明显的频率依赖性. Rayleigh分析显示，20BI-PT样品中内在本征因素及可翻转畴对介电非线性的贡献和15BI-PT基本相同，但是外在因素的贡献没有15BI-PT的贡献大，这可能和20BI-PT样品中晶粒111相对取向率较高有关.

英文摘要：

High-temperature piezoelectric thin films of 0.20BiInO3-0.80PbTiO3 （20BI-PT） were prepared via pulsed laser deposition and investigated by comparison with 0.15BiInO3-0.85PbTiO3（15BI-PT）. XRD patterns show that （100） peak of 20BI-PT has been split, indicating a higher tetragnality than in 15BI-PT. FESEM images reveal some triangular grains corresponding to [111]-oriented grains in 20BI-PT. The remanent polarization （Pr） and coercive field （Ec） of 20BI-PT are ～ 28 μC/cm2 and ～120 kV/cm, respectively. It is shown that the transverse piezoelectric coefficient e31, f keeps almost the same in 20BI-PT and 15BI-PT. The temperature dependence of dielectric permittivity in 20BI-PT reveals a higher Curie temperature （590 ℃） than that in 15BI-PT and no apparent frequency dependence is detected. Rayleigh analyses are performed to identify the extrinsic contributions to dielectric nonlinearity for different x. It is seen that x=0.15 exhibits greater extrinsic contributions to dielectric nonlinearity than the other compositions.