利用椭偏光谱技术可以快速准确地获得薄膜的厚度、光学常数等信息,在材料学本科及研究生相关专业的教学中占有重要地位.但教学中大多注重理论原理分析,而对于椭偏解谱建模较少涉及.本文较全面地介绍了解谱中常用的各种模型并详细阐述了各自的适用范围,进一步通过应用实例系统研究了椭偏解谱建模的方法和技巧.
The thickhess and optical constants of the films can be obtained accurately and quickly by spectroscopic ellipsometry,and it is very important in the college physics teaching. But the emphasis is mainly on the theory analysis. In this paper, many useful models are introduced and their applicable area is also presented in detail. Furthermore,the technical skills are discussed by means of several examples.