欢迎您！东篱公司
退出
-
申报数据库
-
立项数据库
-
成果数据库
-
项目获奖数据库
中文摘要：
随着深亚微米工艺的广泛应用,持续攀升的软错误率对宇航设备的电路可靠性造成了极大影响。针对现有冗余防护技术面积开销大的不足,将概率统计的思想运用到有限状态机（FSM）的软容错设计上,提出了选择部分状态冗余的容错方法。在Markov链模型的基础上,计算出各状态概率,从而为状态冗余提供依据。与未经选择状态冗余的电路相比,以平均增加14.9%的面积开销为代价,这种电路可屏蔽87.6%的时序逻辑单翻转（SEU）。
英文摘要：
Since deep submicron technology is widely used in microprocessors,increasing soft error rate greatly affects the reliability of controllers.In this paper,the idea of statistical probability is applied to soft fault-tolerant design for finite state machine（FSM）.Based on a Markov chain model,a redundancy state selection method is proposed.Compared with the original circuit,this design can mask 87.6% single event upset（SEV） at the cast of additional 14.9% area overhead in average.
同期刊论文项目
同项目期刊论文
A scheme of test data compression based on coding of even bits marking and selective output inversio
The Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Micropro
期刊信息
位置：