为了进一步研究微滤过程中腐殖酸对微滤膜的污染机制,通过运用原子力显微镜(AFM),结合自制的PVDF胶体探针考察了不同的pH、离子强度以及钙离子浓度等水质条件下膜-腐殖酸与腐殖酸-腐殖酸之间微观黏附力的变化趋势以及与膜的通量衰减幅度之间的相关性.结果发现,微观黏附力是膜面污染产生的根本原因.由于pH的电性中和以及离子强度的电性屏蔽作用,膜-腐殖酸以及腐殖酸-腐殖酸之间黏附力随着pH的减小或离子强度的增大都呈增大趋势;而随着钙离子浓度的增大,由于少量钙离子的"架桥"作用以及过量时的电性中和作用,两种黏附力先增大后减小.各条件下,膜-腐殖酸与腐殖酸-腐殖酸之间黏附力都呈相同的变化趋势,且与对应污染膜的通量衰减幅度具有正相关性,为更加深入了解膜污染的形成机制提供了一定的理论支持.
To further unravel the humic acid(HA) fouling mechanism during microfiltration under different conditions,such as pH,ionic strength,the concentration of calcium ions,atomic force microscopy(AFM) combined with self-made PVDF colloidal probe was applied to determine the relationship between the adhesion forces of membrane-HA or HA-HA and the flux decline of membrane. The results indicate adhesion forces were the main reason of membrane fouling. With the decrease of pH or increase of the ionic strength,due to the electrical neutralization caused by pH and electrical shielding effect of ionic strength,the adhesion forces of membrane-HA and HA-HA increased. Because of the comprehensive effect of"salt bridge"and electrical neutralization,there was a transition from increase to decrease for the adhesion forces of membrane-HA and HA-HA as the doses of calcium ions increased. In all cases,both of membrane-HA and HA-HA adhesion forces had the same variation tendency,which displayed a good correlation with the flux decline trends during fouling experiments,respectively,and provided certain theoretical support to further understand the formation mechanism of membrane fouling.