作者机构:[1]Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
相关基金:Project supported by the National High Technology Research and Development Program of China (No. 2006AA01Z256), the State Key Development Program for Basic Research of China (Nos. 2006CB604901, 2006CB604902), and the National Natural Science Foundation of China (No. 90401025).Acknowledgement The authors would like to thank Wang Baojun, Zhou Fan, Shu Huiyun for their experimental help, and Zhao Lingjuan, Wang Lufeng, Bian Jing, An Xin for their support on the device test.