中文摘要：

针对当前电子装备测试性验证试验中故障样本选取缺少有效的定量化手段的问题,提出一种综合考虑故障率、严酷度、破坏性和注入费用的模拟电路故障样本选取方法。首先,基于层次分析、敏感性分析、元器件工作参数分析和注入费用分析等方法为上述4个要素分别建立定量模型;然后,构建了一个考虑上述4个要素的综合指标,用于描述故障样本的重要度,并以此作为故障样本选取的依据;最后,通过Pspice仿真对该方法进行了实验应用。仿真结果表明,所提方法可操作性强,适用于测试性验证的工程实践。

英文摘要：

With the fault sample lacking of effective quantitative methods in the testability demonstration experiment,a comprehensive solution is proposed,which takes failure rate,severity,destructiveness and injection cost of analog circuits in account.Firstly,quantitative models are built for the aforementioned four factors based on the methods including analytic hierarchy process（AHP）,sensitivity analysis,power consumption analysis,injection cost analysis,etc.Secondly,to describe the importance degree of the fault samples,a comprehensive index considering the aforementioned four factors is constructed as the criterion of the fault sample selection procedure.Finally,apply this method in experiment through Pspice.The experimental results show that the proposed method is operative,and can be applied to the engineering practice of the testability demonstration.