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中文摘要：
为了同时解决目前SOC测试工作中面临的测试数据量、测试功耗、测试时间三方面的难题，提出一种基于random access scan架构的SOC测试方法．该方法通过改进扫描单元的结构，减少了硬件开销，同时利用列地址信号来控制测试过程，减少测试数据量和测试时间．在ISCAS’89基准电路上进行的实验表明，该方法与传统的串行扫描技术相比，平均数据压缩率可以达到559／6，测试速度提升2倍以上，同时，其测试的平均功耗几乎可以忽略不计．
英文摘要：
A new random access scan approach is developed to reduce test data volumes, scan power dissipations and test application time. Through improving the RAS scan cell structure, hardware overhead can be reduced, but at the same time test data volumes and test application time can be reduced by the use of the column address signal. Experiments on ISCAS＇89 benchmark circuits have shown an average reduction of 55% in test data volumes and an average reduction of 52% in the test application time compared with the serial scan method; meanwhile, the average test power dissipations can be ignored.
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