中文摘要：

为了进一步研究贴片元器件性能,介绍了一种基于探针台的测量系统。该系统包括上位机界面控制和下位机测量系统控制。上位机界面是由VC＋＋设计完成;下位机是以MSP430F449单片机为核心,并在外围加以双极性A/D转换芯片AD574设计完成。最后,通过RS232串口使上位机和下位机完成了通信。测试结果表明,该探针台系统可以方便、精确地给出测量结果。

英文摘要：

In order to further research property of SMT components,a measuring system based on probe station was introduced.The system included upper computer of interface controlling and lower computer of measuring system controlling.The PC was used to design upper computer by VC＋＋.The microcontroller MSP430F449 and a bipolar chip AD574 were used to design lower computer.Finally,by serial port the upper computer and the lower computer could be communicated with each other.Testing results show that this probe station could give conveniently and accurately measurement results.