建立了一套以可调谐半导体激光器做光源的连续波光腔衰荡光谱装置,简单介绍了连续波光腔衰荡光谱技术与脉冲光腔衰荡光谱技术的区别。将连续波光腔衰荡光谱技术与介质阻挡放电等离子体技术相结合,对等离子体中的HO2自由基进行了原位定量测量,同时考察了HO2自由基数密度随放电电压和体系中氧气含量变化情况。实验结果表明:随着放电电压和体系中氧气含量的增加而增加的HO2自由基数密度分别出现极大值。
An apparatus of continuous wave cavity ring-down spectroscopy (cw-CRDS) has been constructed. The use of cw-CRDS technique for in situ quantitative measurements of HO2 radicals in dielectric barrier discharge(DBD) HCHO/H20/OJHe plasmas is described. The influences of discharge voltage and O2 concentration on number density of HO2 have been studied. Results show that with increasing applied voltage and O2 concentration, the HO2 protuction all increases initially and then decreases.