针对材料发射率数据日益增长的需求,建立了超高温傅里叶变换(FT)光谱发射率测量系统.为校准材料光谱发射率的测量结果,建立了包含辐射传交换、固体热传导、辐射测温在内的发射率校准模型.通过校准模型定量分析了试样辐射热损、厚度、热导率等因素引起的发射率测量误差.结果表明,这些因素均导致试样测量温度偏高,而发射率测量结果偏低.测量了真空环境下2000℃时纯度为99.99%石墨的光谱发射率曲线.采用模型校准后的发射率曲线与文献比较,取得了比较一致的结果.该方法在超高温发射率测量技术中可以有效地提高测量精度.
To correct measurement errors in spectral emissivity measurement based on FT-IR in the vacuum ambient,the emissivity calibration model has been constructed,including radiation thermal losses,one dimension heat transfer and radiation thermometry.The emissivity error has been quantitatively analyzed.The results show that the higher the sample temperature is,the lower is the value of the emissivity.This result is induced by thermal losses,material thermal conductivity and sample thickness.To reduce the error induced by these factors,the system should be calibrated.The calibrated spectral emissivity of high-purity graphite sample at 2000℃ agrees very well with the results reported by G.Neuer and G.Jaroma-Weiland.