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Theoretical Study on the Bilayer Buckling Technique for Thin Film Metrology
  • ISSN号：1546-2218
  • 期刊名称：Computers, Materials and Continua
  • 时间：0
  • 页码：105-120
  • 相关项目：单细胞压痕实验分析
作者： Jia, Fei|Zheng, Xiu-Peng|Cao, Yan-Ping|Feng, Xi-Qiao|
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单细胞压痕实验分析
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