用原子转移自由基聚合方法在硅片表面制备了2,3,4,5,6-五氟苯乙烯聚合物刷.利用椭圆偏正光测厚仪、接触角测定仪和X射线光电子能谱仪对薄膜结构进行了表征.
Atom-transfer radical polymerization has been used to prepare low surface energy polymer brush of 2, 3, 4, 5, 6-pentafiuorostyrene on the surface of silicon wafer. The polymer brush was analyzed using elipsometry, contact angle and X-ray photoelectron spectroscopy.