运用第一性原理密度泛函理论结合非平衡格林函数方法,对3个Si原子构成的直线链耦合在Au(100)面形成的三明治结构的纳米结点的电子输运进行计算.结果得到结点电导随距离的变化,当dz=1.584 nm时,结合能最小,结构最稳定,此时Si-Si键长为0.216 nm,Si-Au键长为0.227 nm,电导为0.729 G0(G0 =2e2/h),其电子传输通道主要由Si原子的px、py轨道电子构成;随着外电压的增大,结点的电导减小,而其Ⅰ-Ⅴ曲线表现出线性特征.
Electron transport in a linear atomic chain composed of 3 silicon atoms and sandwiched between gold electrodes is investigated with combination of density functional theory and non-equilibrium Green's function method. Relationship of conductance with distance is calculated. It shows that: At a distance of 1. 584 nm, binding energy of junctions is minimum, structure is the most stable, Si-Si bond length is 0. 216 nm, Si-Au bond length is 0. 227 nm, conductance is 0. 729 Go (Go = 2e2/h), electron transport channels mainly consist of p,, py orbital electrons of Si atoms. With increase of voltage conductance decreases and I-V curve of nanoscale junctions at equilibrium position shows linear feature.