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Novel Layout Technique for Single-Event Transient Mitigation Using Dummy Transistor
  • ISSN号：1530-4388
  • 期刊名称：Device and Materials Reliability, IEEE Transaction
  • 时间：2013
  • 页码：177-184
  • 相关项目：吉赫兹锁相环单粒子瞬变效应建模与加固技术研究
作者： Jianjun Chen|Shuming Chen|Yibai He|Junrui Qin|Bin Liang|Biwei Liu|Pengcheng Huang|
同期刊论文项目
吉赫兹锁相环单粒子瞬变效应建模与加固技术研究
期刊论文 28 会议论文 19 专利 1
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