中文摘要：

测试选择优化问题作为复杂电子装备的诊断设计优化过程中的一个关键问题，是一个典型的集合覆盖问题，属于经典的N—P难题；针对现有优化方法存在的不足，通过对测试选择问题的分析，提出一种基于二进制粒子群优化算法的测试选择优化方法，将备选测试集合采用二进制粒子编码，构造粒子适应度函数，通过粒子群搜索实现了快速求解；与传统方法相比较，该方法搜索速度快，优化效果明显，该方法已在工程实践中得到应用。

英文摘要：

Test selection optimization problem is a key problem of diagnostic design for complex electronic equipment, and it is also a traditional set covering problem, which belongs to an N-P completeness problem. It puts forward a test selection optimization method based on binary particle swarm optimization algorithm to overcome the shortages of existing methods. The alternate test set is coded as a binary particle, and the fitness function of particle is built up in the method, and then, the optimal solution can be get quickly construct through the searching of particle swarm. Searching speed of the method is faster than traditional methods, and the optimal results are also better. The method has been used in engineering practice.