中文摘要：

脉冲高压下设备的局部放电检测是一种校验高压电气设备在冲击电压作用下绝缘性能与设备老化的有效方法,为能及时发现采用油纸绝缘方式的电气设备故障隐患而设计油纸绝缘局部放电检测系统。该研究搭建了基于固态开关的冲击电压源,较大抑制传统依靠球隙电弧开关的冲击源导通瞬间引起的强烈干扰,利用光电检测与试样接地线串接取样电阻的方法,检测油纸绝缘沿面放电信号。光电检测在试样高压端串入采样电阻,通过光学元件将采样电阻上的电流信号转换为光信号进行传输,降低空间电磁干扰的影响,最后通过光电转换装置实现电流信号的采集。试验结果表明：基于固态开关的冲击源干扰较低,稳定性强,接地线串接取样电阻方式在波前时间段内信号振荡剧烈,无法检测2μs内的局放信号,而光电检测方法可以更好的检测到波前时间段内的局部放电,干扰持续时间小于0.5μs。

英文摘要：

Partial discharge detection under impulse voltage is an effective method for monitoring the insulating properties and the aging of high-voltage electric equipment. It is of great practical significance for timely discovering potential safety hazard and ensuring the safe operation of equipment. In this paper, an impulse voltage source is set up with solid-state switch which can better inhibit the strong interference than the traditional ball gap arc switch source. The optoelectronic technique and the sampling resistor connected with ground wire are adopted to investigate the partial discharge characteristics of creeping discharge under lighting impulse voltage. The optoelectronic technique owns an advantage of measuring a partial discharges impulse current at the high-potential electrode with isolating the interference of the power source. It can obtain almost all the transient current flowing through the high-potential electrode and isolate the interference of the ground wire. Due to the fiber optic transmission, the system picks up less electromagnetic noise from the impulse generator. By concatenating a sampling resistor in the high-potential side, the current signal through the resistor is transmitted to the optical emitter. The photoelectric conversion device converts the light signal into the electrical signal. The result shows that the optoelectronic measurement can successfully detect the wave head period of partial discharge under the impulse voltage source with solid-state switch which has the advantages of low interference and high reliability. Notably, the optoelectronic measurement has a less than 0.5 μs blind region while there is a 2μs blind region in the sampling resistor signal which cannot detect the PDs.