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Impact of continuing scaling on the device performance of 3D cylindrical junction-less charge trappi
  • 期刊名称：Journal of Semiconductors
  • 时间：2015.9.1
  • 页码：79-84
  • 相关项目：面向三维集成的纳米尺度电荷陷阱存储器机理与可靠性研究
作者： 徐强|唐兆云|李春龙|叶甜春|
同期刊论文项目
面向三维集成的纳米尺度电荷陷阱存储器机理与可靠性研究
期刊论文 24 会议论文 15
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