Valence band offset of ZnO/Zn0.85Mg0.15O heterojunction measured by x-ray photoelectron spectroscopy
- ISSN号:0003-6951
- 期刊名称:Applied Physics Letters
- 时间:0
- 页码:709-715
- 语言:英文
- 相关项目:稳定、高效的p型ZnO薄膜的制备及器件研究
作者:
Li, B.H.|Zhang, J.Y.|Shan, C.X.|Yao, B.|Zhang, Z.Z.|Zhao, D.X.|Shen, D.Z.|Su, S.C.|Fan, X.W.|Lu, Y.M.|