中文摘要：

以叶绿素快相荧光动力学曲线（OJIP）为探针，探讨了高温胁迫对高产小麦品系01-35灌浆后期光系统Ⅱ（PSⅡ）功能的影响．结果表明，在37℃～43℃范围内，随温度升高QA还原程度和还原速率增大，至43℃时分别比室温下增加了23．89％和24．09％，表明QA→QB的电子传递受到抑制；43℃时PSⅡ的电子受体库降至室温下的47．4％，表明高温胁迫伤害了PSⅡ受体库；而PSⅡ供体侧未受到影响．当温度达到46℃时，QA还原程度和还原速率分别比室温下增加了13．95％和20．48％，但比43℃时显著下降，而PSⅡ电子受体库与43℃时相比无显著变化，表明46℃时PSⅡ供体侧受到伤害．与对照品种鲁麦14相比，高温胁迫下高产小麦的捕光色素复合体仍能捕获较多的光能，而且将捕获的光能更多的用于电子传递，表明高产小麦的捕光色素复合体及电子传递体耐受高温的能力较强，能够维持较高的电子传递能力．

英文摘要：

By using fast OJIP chlorophyll a （ Chl a） fluorescence transients, this paper studied the effects of short-term high temperature stress on the flag leaf photosystem Ⅱ （PS Ⅱ ） functions of high-yielding winter wheat cuhivar 01-35 at its late grain filling stage. The results showed that with the temperature raised from 37 ℃ to 43 ℃, the extent and velocity of QA reduction enhanced gradually, being 23.89% and 24. 09% higher at 43 ℃ than at room temperature, respectively, which suggested that the electron transport from QA to QB was inhibited. The electron acceptor pool of PSⅡ including QA, QB and PQ at 43℃decreased to 47.4% of that at room temperature, indicating its being damaged. The electron donor side of PSⅡ was not damaged from 37℃ to 43℃. When temperature raised to 4℃ , the extent and velocity of QA reduction were 13.95% and 20.48% higher than those at room temperature, respectively, but decreased obviously, compared with those at 43℃. In contrast, the electron acceptor pool of PS Ⅱ at 46℃ had no obvious change, compared with that at 43℃, indicating that the electron donor side of PS Ⅱ at 46℃ was damaged. Comparing with cuhivar Lumai 14, the light harvesting complex （ LHC Ⅱ ） of high-yielding wheat cuhivar 01-35 could harvest more sun energy, and distributed more absorbed energy into electron transport, suggesting that the LHCⅡ of cuhivar 01-35 could endure a certain higher temperature, and maintain higher electron transport capacity.