基于表面等离子共振(surface plasmon resonance,SPR)技术的检测方法是一种灵敏度极高的光学检测方法,用于基因芯片的检测时具有高灵敏、免标记、无污染等优点,是一种很有发展潜力的芯片检测方法。将酵母Y5基因的特异性片段5′端修饰巯基后作为探针,利用单分子层自组装法把探针固定在金膜表面,应用列扫描表面等离子共振成像检测系统研究和分析DNA芯片上探针点阵的杂交信息,从而建立一套基于列扫描表面等离子共振检测系统的DNA芯片的制备和检测分析技术。实验结果表明:37℃条件下探针的最佳固定时间为5~7h,杂交特异性良好,杂交的最佳时间为5~30min。探针浓度低于0.5μmol/L时,杂交效率高而且SPR信号变化明显,探针浓度达到20μmol/L时SPR响应达到最大。
Scanning surface plasmon resonance (SPR) detection system was applied to analyze hybridization information in DNA chip. Yeast Y5 gene specific fragment modified with thiol at 5′ end was taken as a specific gene probe, self-assembled monolayer method was applied to immobilize probe on the surface of gold film. Protocol for DNA chip and SPR analysis were established. Data showed that the best immobilizing time of probe was from 5 to 7 h at 37℃ and the best hybridization time was 30 min. With probe concentrations below 0.5 μmol/L the results gave higher hybridization efficiency and significant changes of SPR signal. SPR response reached a maximum at probe concentration of 20 μmol/L.