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硅基掺锰富硅氧化硅薄膜的电致发光
  • ISSN号:1000-0593
  • 期刊名称:光谱学与光谱分析
  • 时间:0
  • 页码:1736-1939
  • 语言:中文
  • 分类:O482.3[理学—固体物理;理学—物理]
  • 作者机构:[1]北京大学物理学院 人工微结构与介观物理国家重点实验室,北京100871
  • 相关基金:国家自然科学基金项目(10574008,10674012,50732001)和国家重点基础研究发展计划“973”计划项目(2007CB613401)资助
  • 相关项目:纳米硅在Er离子1.54 微米电致发光中的作用机理
作者: 冉广照|
中文摘要:

硅光子学中的关键问题是研制高效率的硅基光源,文章为此提出了一种实现硅基发光的方法。采用共溅射的方法在n+型重掺杂硅衬底上制备了富硅氧化硅(SiO2∶Si)薄膜,然后用热扩散法进行了锰(Mn2+)掺杂和光学活化。高分辨透射电镜观察表明薄膜中形成了3~5 nm的硅纳米晶体。该薄膜在紫外光照射下发射出明亮的绿光,光致发光谱峰位在524 nm(2.36 eV),一般认为这是来自Mn2+能级4T1 →6A1基态跃迁的绿光辐射;其荧光寿命为0.8 ms。将该掺锰富硅二氧化硅(SiO2∶Si∶Mn2+)做成电致发光结构,在低反偏电压下观察到近乎白色的电致发光(EL),光谱范围覆盖了400~800 nm。研究表明,该电致发光谱来源于薄膜中的Mn2+以及氧化硅中的缺陷发光中心两者光谱的叠加;Mn2+的发光是靠薄膜中的热电子来激发的;并由此探讨了薄膜中的硅纳米晶体在电致发光过程中的作用。

英文摘要:

Abstract Recently, a monolithic integration of optics and electronics in a single Si chip has attracted a great deal of attention due to its attractive application prospects: the potential for forming high speeded information processing and transmission, and inex- pensive and low power silicon chip. Developing high-efficiency silicon-based light sources is the main task in silicon photonies. In the present paper the authors explore a potential way for silicon-based light-emitting application. A Mn^2+-activated silicon-rich silicon oxide (SiO2 : Si : Mn^2+ ) film was prepared on the n+-type silicon substrate using co-sputtering technique followed by doping and activation of Mn with a thermal diffusion method. High-resolution transmission electronic microscope study shows that the film is embedded with 3-5 nm silicon nanocrystals. Bright green photoluminescence (PL) from the film was observed under ultraviolet radiation and peaked at 524 nm (2. 36 eV), the decay time of which is 0. 8 ms. It is generally believed that the green radiation originates from ^4T1→^6A1 transition in Mn^2+. The PL excitation spectrum of the film, monitored at 524 nm, has a peak of 254 nm, similar to that of the Zn2SiO4 : Mn film. It is believed that the strong 254 nm absorption is attributed to Mn^2+ → Mn^3+ ionization or d^5→d^4s transition. A very broad electroluminescence spectrum ranging from 400 to 800 nm, covering almost the whole visible band, was observed from the device made of the SiO2 : Si : Mn^2+ film at low reverse biases. The threshold voltage of the device is as low as 5 V. Spectra of the device demonstrate that the electrolumineseence is attributed to Mn^2+ and centers in the Si-rich SiO2 film. The authors interpret that Mn^2+ excitation is mainly due to direct impact excitation of hot electrons, silicon nanocrystals in the SiO2 film help electrons tunnel from a silicon nanocrystal to an adjacent one, and are advantageous for generating hot electrons to excite Mn^2+.

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期刊信息
  • 《光谱学与光谱分析》
  • 中国科技核心期刊
  • 主管单位:中国科学技术协会
  • 主办单位:中国光学学会
  • 主编:高松
  • 地址:北京海淀区魏公村学院南路76号
  • 邮编:100081
  • 邮箱:chngpxygpfx@vip.sina.com
  • 电话:010-62181070
  • 国际标准刊号:ISSN:1000-0593
  • 国内统一刊号:ISSN:11-2200/O4
  • 邮发代号:82-68
  • 获奖情况:
  • 1992年北京出版局编辑质量奖,1996年中国科协优秀科技期刊奖,1997-2000获中国科协择优支持基础性高科技学术期刊奖
  • 国内外数据库收录:
  • 俄罗斯文摘杂志,美国化学文摘(网络版),荷兰文摘与引文数据库,美国工程索引,美国生物医学检索系统,美国科学引文索引(扩展库),英国科学文摘数据库,日本日本科学技术振兴机构数据库,中国中国科技核心期刊,中国北大核心期刊(2004版),中国北大核心期刊(2008版),中国北大核心期刊(2011版),中国北大核心期刊(2014版),英国英国皇家化学学会文摘,中国北大核心期刊(2000版)
  • 被引量:40642