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Experimental measurements and theoretical calculations of the atomic structure of materials with subangstrom resolution and picometer precision
  • ISSN号:0023-074X
  • 期刊名称:《科学通报》
  • 时间:0
  • 分类:O562.1[理学—原子与分子物理;理学—物理] TB332[一般工业技术—材料科学与工程]
  • 作者机构:[1]Beijing National Center for Electron Microscopy, KeyLaboratory of Advanced Materials of Ministry of Education ofChina and State Key Laboratory of New Ceramics and FineProcessing, School of Materials Science and Engineering,Tsinghua University, Beijing 100084, China
  • 相关基金:supported by the National Basic Research Program of China(2009CB623701,2011CB606406);the National Natural Science Foundation of China(51371102,51390475,51071092,11374174,and 51390471);the Foundation for the Author of National Excellent Doctoral Dissertation of China;the Program for New Century Excellent Talents in University;the Scientific Foundation for Returned Overseas Chinese Scholars,Ministry of Education
中文摘要:

Lattice defects are unavoidable structural units in materials and play an important role in determining material properties.Compared with the periodic structure of crystals,the atomic configurations of the lattice defects are determined by the coordinates of a large number of atoms,making it difficult to experimentally investigate them.In computational materials science,multiparameter optimization is also a difficult problem and experimental verification is usually required to determine the possibility of obtaining the structure and properties predicted by calculations.Using our recent studies on oxide surfaces as examples,we introduce the method of integrated aberration-corrected electron microscopy and the first-principles calculations to analyze the atomic structure of lattice defects.The atomic configurations of defects were measured using quantitative high-resolution electron microscopy at subangstrom resolution and picometer precision,and then the electronic structure and dynamic behavior of materials can be studied at the atomic scale using the firstprinciples calculations.The two methods complement each other and can be combined to increase the understanding of the atomic structure of materials in both the time and space dimensions,which will benefit materials design at the atomic scale.

英文摘要:

Lattice defects are unavoidable structural units in materials and play an important role in determining material properties. Compared with the periodic structure of crystals, the atomic configurations of the lattice defects are determined by the coordinates of a large number of atoms, making it difficult to experimentally investigate them. In computational materials science, multiparameter optimization is also a difficult problem and experimental verification is usually required to determine the possibility of obtaining the structure and properties predicted by cal- culations. Using our recent studies on oxide surfaces as examples, we introduce the method of integrated aberra- tion-corrected electron microscopy and the first-principles calculations to analyze the atomic structure of lattice defects. The atomic configurations of defects were mea- sured using quantitative high-resolution electron micros- copy at subangstrom resolution and picometer precision, and then the electronic structure and dynamic behavior of materials can be studied at the atomic scale using the first- principles calculations. The two methods complement each other and can be combined to increase the understanding of the atomic structure of materials in both the time and space dimensions, which will benefit materials design at the atomic scale.

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期刊信息
  • 《科学通报》
  • 北大核心期刊(2011版)
  • 主管单位:中国科学院
  • 主办单位:中国科学院
  • 主编:周光召
  • 地址:北京东黄城根北街16号
  • 邮编:100717
  • 邮箱:csb@scichina.org
  • 电话:010-64036120 64012686
  • 国际标准刊号:ISSN:0023-074X
  • 国内统一刊号:ISSN:11-1784/N
  • 邮发代号:80-213
  • 获奖情况:
  • 首届国家期刊奖,中国期刊方阵“双高”期刊,第三届中国出版政府奖
  • 国内外数据库收录:
  • 美国化学文摘(网络版),美国数学评论(网络版),美国工程索引,日本日本科学技术振兴机构数据库,中国中国科技核心期刊,中国北大核心期刊(2004版),中国北大核心期刊(2008版),中国北大核心期刊(2011版),中国北大核心期刊(2014版),中国北大核心期刊(2000版)
  • 被引量:81792