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Leakage Current Optimization Techniques During Test Based on Don＇t Care Bits Assignment

ISSN号：1000-9000
期刊名称：《计算机科学技术学报：英文版》
时间：0
分类：TP3[自动化与计算机技术—计算机科学与技术]
作者机构：[1]School of Computer and Information, Hefei University of Technology, Hefei 230009, China, [2]Key Laboratory of Computer System and Architecture, Institute of Computing Technology, Chinese Academy of Sciences Beijing 100080, China
相关基金：This work was supported in part by the National Natural Science Foundation of China （NSFC） under Grant Nos. 60576031, 60633060, 60606008, 90607010, the National Grand Fundamental Research 973 Program of China under Grant Nos. 2005CB321604 and 2005CB321605, and the Science Foundation of Hefei University of Technology under Grant Nos. 070501F and 060501F. Y. Han＇s work is also supported by the fund of Chinese Academy of Sciences due to the President Scholarship.

作者：王伟[1,2], 胡瑜[2], 韩银和[2], 李晓维[2], 张佑生[1]

关键词：电量泄漏, 能量泄漏, 优化技术, 向量, leakage current, don＇t care bits, minimum leakage vector, leakage power

中文摘要：

Wei Wang received his B.Eng. and Ph.D. degrees both in computer science from Hefei University of Technology in 2001 and 2007, respectively. He is presently a postdoctoral fellow in Institute of Computing Technology. His research interests include low power test, design-for-testability, low power design and fault tolerance. He is amember of China Computer Federation. E-mail： wang_wei@ict.ac.cn; Yu Hu received her B.S., M.S. and Ph.D. degrees all in electrical engineering from the University of Electronic Science and Technology, Sichuan, China, in 1997, 1999 and 2003, respectively. She is currently an associate professor at Institute of Computing Technology, Chinese Academy of Sciences, Bei- jing, China. Her research interests include design-for-reliability, design-for-testability, and development of EDA tools.E-mail：huyu@ict.ac.cn Yin-He Hart received his B. Eng.＇s degree from Nanjing University of Aeronautics and Astronautics （China） in 1997. Han received his Ph.D. degree in computer science from Institute of Computing Technology, Chinese Academy of Sciences in 2006. His research interests include VLSI/SOC test, ATE architecture design, and high per-formance processor design. He now works in Institute of Computing Technology, Chinese Academy of Sciences.E-mail： yinhes,@ict.ac.cn Xiao-Wei Li received his B.Eng.＇s and M. Eng.＇s degrees in computer science from Hefei University of Technology in 1985 and 1988 respectively, and his Ph.D. degree in computer science from the Institute of Computing Technology, Chinese Academy of Sciences in 1991. He has been a professor since 2000. His research interests include VLSI/SOC design verification and test generation, design for testability, low-power design, dependable com- puting. He is a senior member of IEEE, and an associate editor-in-chief of the Journal of Computer-Aided Design and Computer Graphics （in Chinese）. He now works in Institute of Computing Technology, Chinese Academy of Sciences, China.E-mail： lxw@ict.ac.cn; You-Sheng Zhang received

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