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The impact of X-ray and proton irradiation on HfO2/Hf-based bipolar resistive memories
  • ISSN号：0018-9499
  • 期刊名称：IEEE Transactions on Nuclear Science
  • 时间：2013.12
  • 页码：4540-4546
  • 相关项目：地面模拟空间辐射环境下的技术方法及单粒子效应研究
作者： Weller, R.A.|Linten, D.|Jurczak, M.|Fantini, A.|
同期刊论文项目
地面模拟空间辐射环境下的技术方法及单粒子效应研究
期刊论文 56 会议论文 3
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