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中文摘要：
为了减少测试数据的存储需求并降低测试应用时间，提出一种以折叠计算为理论的多扫描链BIST方案．首先利用输入精简技术在水平方向上压缩测试集，确定相容扫描链，在测试过程中对相容扫描链中的数据进行广播；然后利用折叠计算理论对测试集进行垂直方向上的压缩，使得同一折叠种子生成的相邻测试向量仅有1位不同，且在测试过程中测试向量并行移人多扫描链．在ISCAS标准电路上的实验结果表明，该方案的平均测试数据压缩率为95．07％，平均测试应用时间为之前方案的13．35％．
英文摘要：
In order to reduce the storage requirements of test data and test application time, a BIST scheme based on the theory of folding computing is proposed for multiple scan chains. Firstly, test pattern is horizontally compressed using the input reduction technique, and so the compatible scan chains are designed for broadcasting test data during testing. Secondly, the test set is vertically compressed into a seed set based on the theory of folding computing, and so adjoining test vectors of the same folding seed only differ in one bit position and are shifted into multiple scan chains in parallel during testing. Experiment results on ISCAS benchmark circuits demonstrate the average test compression rate of the proposed scheme is 95.07%, and the average test application time is 13.35% of the previous scheme.
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