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Ni Layer Thickness Dependence of the Interface Structures for Ti/Ni/Ti Trilayer Studied by X-ray Sta
  • ISSN号：1944-8244
  • 期刊名称：ACS Applied Materials & Interfaces
  • 时间：2013.1.1
  • 页码：404-409
  • 相关项目：“交叉相关”实验方法在自由电子激光诊断中的模拟研究
作者： Li, Wenbin|Zhu, Jingtao|Li, Haochuan|Zhang, Zhong|Ma, Xiaoying|Yang, Xiaoyue|Wang, Hongchang|Wang, Zhanshan|
同期刊论文项目
“交叉相关”实验方法在自由电子激光诊断中的模拟研究
期刊论文 7
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