中文摘要：

p 类型 Bi0.52Sb1.48Te3 + 的薄电影 3% Te 被闪光蒸发在玻璃底层上扔。X 光检查衍射和地排放扫描电子显微镜学被执行描绘准备的薄电影，和效果，热电的性质上的退火的参数被调查。这些电影的力量因素与增加免职温度增加了，这被显示出。退火当退火的时间是不到 90 min，退火的温度比 250 低时，同样扔的电影改进了力量因素 ??????????????? ㈠吗？？

英文摘要：

Thin films of p-type Bi0.52Sb1.48Te3 ＋ 3 % Te were deposited on glass substrates by flash evaporation, X-ray diffraction and field-emission scanning electron microscopy were performed to characterize the thin films, and the effects of preparation and annealing parameters on the thermoelectric properties were investigated. It was shown that the power factors of the films increased with increasing deposition temperature. Annealing the as-deposited films improved the power factors when the annealing time was less than 90 min and the annealing temperature was lower than 250℃. A maximum power factor of 10.66 μW cm-1 K-2 was obtained when the film was deposited at 200℃ and annealed at 250℃ for 60 min.